XRF thickness measurement system Veeco 300-AT

Description: The XRF 300-AT is an advanced X-ray microfluorescence (XRMF) spectrometer capable of measuring the thickness of most single and multi-layer coatings on just about any base.  The XRF 300-AT can simultaneously determine the thickness and composition of binary-alloy deposits such as tin-lead, palladium-nickel, nickel-iron or zinc-nickel.  The XRF 300-AT is based upon an enclosed sample chamber designed for small to medium sized parts. The XPert software package drives the X-ray system and allows you to write programs that control the motorized stage and most XPert functions. Before samples can be measured, the system must be calibrated.  During a calibration procedure, the machine establishes a relationship between known thicknesses of a particular material (ie standards) and the intensity of fluoresced X-rays emitted from that material at each thickness.  The X-ray intensity is measured in terms of countrate (CPS).  For each application (ie coating/base combination) a calibration procedure must be carried out.

Technical details: Type: XRF thickness measurement system 300-AT (Veeco) Year of construction: 1993 Micro focus X-ray tube: Mo target, 0.2 mm focal spot, 5 to 50 kV, 0.06 to 1 mA, air cooled Primary collimator mirror with internal standards: 0.075, 0.10, 0.15, 0.30, 0.40, 0.65 mm spots Proportional counter (Xe filled) Multi channel analyser: 1024 channels, 15000 CPS processing, dead time correction, pile up rejection Constant view video system: aligned with X-ray beam, fiber illumination, magnification 40 x and 80 x Primary (Cu), detector (Co, Ni, V) and numeric filters Programmable joystick controlled XYZ stage Full diagnostic monitoring Automatic calibration and alignment

 

Room: 91.03

 

More Technical information: Techinfo@mtm.kuleuven.be

 

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