Chemical equipment: Wavelength-dispersive X-ray fluorescence spectrometer

Wavelength-dispersive X-ray fluorescence spectrometer

Description:
The great flexibility and range of the various types of X-ray fluorescence (XRF) spectrometerrs together with their high sensitivity and good inherent precision, make them ideal for quantitative analysis. Wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers are typically employed for both routine and non-routine analyses of a wide range of products such as ferrous and non-ferrous alloys, oils, slags and sinters, ores and minerals, thin films, glasses, powders, solutions, etc.
The Philips PW 2400 belongs to the latest generation of XRF spectrometers and is able to analyse solids, powders and liquids. Known as well as totally unknown samples can be analysed.
The Super-Q software can perform three kinds of measurements. A qualitative analysis, in most cases done on an unknown sample. The goal of this measurement is to identify all elements present in the sample.
When a sample is qualitatively defined, an automated semi-quantitative analysis can be carried out. The Semi-Q program gives a first approximation of the composition of the sample. In most cases this approximation will do. If the result of a semi-quantitative analysis is not satisfying a quantitative analysis using known standards for a calibration, can be carried out. This is the most accurate way of analysis. Certified reference materials or self made standards can be used.
The WD-XRF can identify and quantify elements from Be (4) up to U (92), in a range from % to ppb level, depending on the element and the surrounding matrix. The accuracy and precision of the analyses is in most cases limited by the quality of the samples and the standards.
Generally speaking WD-XRF offers the possibility to analyse very accurate, in a non-destructive way, a wide range of materials, qualitatively as well as quantitatively.

Technical details:

Type: automatic sequential wavelength dispersive X-ray fluorescence spectrometer PW 2400 (Philips)
Year of construction: 1996
HT generator: high frequency (ultra sonic), microprocessor controlled, 60 kV, 125 mA, 3000 W max., 0.0005 % stability
Tube: super sharp end window X-ray tube, 60 kV, 125 mA, 3000 W max., Rhodium anode
Spectrometer: sample changer (2 positions), spinner 30 rpm, 8 analysing crystals (LiF 200, LiF 220, PE 002, Ge 111, PX1 multilayer, PX2 multilayer, PX4 multilayer, TlAP 100 coated), Argon flow counter 2 µm (13° to 148° 2theta, 2000 KCPS max.), scintillation counter (0° to 104° 2theta, 1000 KCPS max.), masks 10, 25, 30 and 35 mm
Goniometer: theta/2theta decoupled, direct optical position sensors, slewing speed 40° 2theta/s, scanning speed 0.0001° to 2° 2theta/s,angular accuracy 0.0025° theta,2theta, angular reproducibility 0.0001° theta,2theta
Multi channel analyser: non-linearity > 1 %
Filters: Al (200,750 µm), Brass (100,300 µm), Pb (1000 µm)
Primary collimators: 150, 300, 700 µm
Beam path: Vacuum or He (liquids)
MS Windows based Super-Q / Semi-Q software
Peripherals: automatic fusion machine Perl’X 3 (Philips)

Room: 91.03

More Technical information: Techinfo@mtm.kuleuven.be